With integration encompassing not just the logic for a communications chip but also the physical-layer (PHY) analog components, a lot of things get more complicated. It's easy to anticipate the design ...

When you purchase through links on our site, we may earn an affiliate commission. Here’s how it works. About the same time that the FCC announced its trial analog shutoff experiment in the Wilmington, ...

ATPG (automatic-test-pattern generation), BIST (built-in self-test), and structural-test techniques have kept digital-test costs nearly constant during the explosion in digital complexity. Without ...

BEST Electronics and Components Co., Inc. (BECCI) introduces the QM1000(TM )quad-site instrument for testing analog and mixed signal semiconductor devices. BEST Electronics and Components Co., Inc.

Wanting to test the response curves on some analog parts, [Don Sauer] devised a way of using simple tools to graph analog tests on a computer. Here you can see the results of testing NPN, PNP, NMOS ...

While the analog and mixed-signal components are the leading source of test escapes that result in field failures, the lack of tools to analyze the test coverage during design has made it difficult ...

The amount of electronic content in passenger cars continues to grow rapidly, driven mainly by the integration of various advanced driving and safety features. The industry’s move towards fully ...

About the same time that the FCC announced its trial analog shutoff experiment in the Wilmington, N.C. market, an alliance of 11 Orlando, Fla. stations announced that they too will do their own analog ...